DocumentCode :
325769
Title :
Some New Testing Techniques For Precision Zener Diodes
Author :
Spreadbury, P.J.
fYear :
1988
fDate :
32280
Firstpage :
29
Lastpage :
32
fLanguage :
English
Publisher :
iet
Conference_Titel :
Measurements we Couldn't Make Without a Micro, IEE Colloquium on
Conference_Location :
IET
Type :
conf
Filename :
696047
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=325769