Title :
On the determination of neural network based non-linear constitutive relations for quasi-static GaN FET models
Author :
Zarate-de Landa, A. ; Reynoso-Hernandez, J.A. ; Roblin, Patrick ; Pulido-Gaytan, M.A. ; Monjardin-Lopez, J.R. ; Loo-Yau, J.R.
Author_Institution :
Centro de Investig. Cienc. y de Educ. Super. de Ensenada (CICESE), Ensenada, Mexico
Abstract :
By using a neural network approach that takes into account input/output relationship data along with derivative information in the training process, a fast and straightforward methodology to obtain the quasi-static model of GaN FETs is introduced. This method uses data obtained from pulsed I/V and S-parameter measurements to train three different neural networks which model the drain current, as well as the gate and drain charge functions. The ANN-based model is implemented in Agilent´s ADS™ and validated by comparing the results to measured data.
Keywords :
III-V semiconductors; S-parameters; aluminium compounds; electronic engineering computing; gallium compounds; high electron mobility transistors; neural nets; semiconductor device models; wide band gap semiconductors; ANN-based model; Agilents ADS; AlGaN; S-parameter measurements; derivative information; drain charge functions; drain current; gate charge functions; neural network; nonlinear constitutive relations; pulsed I/V measurements; quasi-static GaN FET models; training process; Artificial neural networks; Logic gates; Microwave FET integrated circuits; Microwave circuits; Microwave integrated circuits; Pulse measurements; AlGaN/GaN HEMT; Transistor non-linear modeling; artificial neural networks;
Conference_Titel :
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location :
Columbus, OH
DOI :
10.1109/ARFTG-2.2013.6737341