Investigating connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

This paper describes some investigations into the repeatability of connection of some waveguide devices in the WM-250 (WR-01) waveguide size over the recommended operational bandwidth 750 GHz to 1100 GHz. Three devices are investigated - a flush short-circuit, an offset short-circuit, and a near-matched load. These devices can be used as calibration standards for network analyzers, and so can be found in network analyzer calibration kits. The repeatability of the measured reflection coefficient is assessed using statistical techniques. The repeatability is expressed in terms of the experimental standard deviation in both the real and imaginary components of the complex-valued linear reflection coefficient. Finally, recommendations are given on propagating uncertainty when these devices are considered as calibration standards during a network analyzer calibration and measurement process.