DocumentCode :
3258215
Title :
Design of Test Structures for Reduced Order Modeling of the Squeeze Film Damping in Mems
Author :
Som, Aurelio ; Ballestra, Alberto
Author_Institution :
Dept. of Mech. Eng., Politecnico di Torino
Volume :
2
fYear :
2006
fDate :
27-29 Sept. 2006
Firstpage :
341
Lastpage :
344
Abstract :
In this work the effect of the squeeze film damping on MEMS structures is studied. As the simulation of the microsystems involves different physical domains, the analysis with numerical methods can turn out remarkably onerous such as when, due to technological reasons, the membrane is built with several holes. In this case the reduced order modeling is preferable. In the present work the non-linear coefficients of equivalent damping and stiffness by finite element models are investigated to be exported in a reduced order model. By means of numerical finite element calculation is studied the sensitivity analysis related to design parameters such as dimension of the plate and the presence, or lack, of holes
Keywords :
damping; finite element analysis; micromechanical devices; reduced order systems; sensitivity analysis; MEMS; design parameters; equivalent damping; finite element models; reduced order modeling; sensitivity analysis; squeeze film damping; test structures design; Analytical models; Damping; Electrodes; Finite element methods; Frequency; Micromechanical devices; Navier-Stokes equations; Shock absorbers; Springs; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Semiconductor Conference, 2006
Conference_Location :
Sinaia
Print_ISBN :
1-4244-0109-7
Type :
conf
DOI :
10.1109/SMICND.2006.284014
Filename :
4063242
Link To Document :
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