• DocumentCode
    3258544
  • Title

    Influence of thickness on field distortion due to space charge migration in LDPE sheet

  • Author

    Kadowaki, K. ; Mitsunari, S. ; Yoshioka, H. ; Nishimoto, S. ; Kitani, I.

  • Author_Institution
    Ehime-Univ., Matsuyama
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    Influence of thickness in LDPE sheet on electrical field distortion and transient external current under dc step voltage are studied. Temporal change in space charge distribution in LDPE sheets of 100, 200 and 300 mum in thickness are measured by PEA method with evaporated A1 electrode or semiconduction rubber electrode under a mean applied field of 1 MV/cm. No temporal changes in space charge distribution are observed for 100 mum-thick-sheet with A1-anode/A1-cathode system. The external current exponentially decreases within a few minutes and then it keeps a constant value. For 300 mum-thick-sheet, however, positive charges from anode are penetrated deeply, so that the maximum field strength becomes much higher than the mean field strength. When semiconduction rubber is used as anode, field distortion due to positive-packet penetration is observed clearly even for 200 mum. The relation between packet-moving and current-increasing will be discussed.
  • Keywords
    electric fields; polyethylene insulation; space charge; DC step voltage; LDPE sheet thickness; PEA method; electrical field distortion; packet moving; size 100 mum; size 200 mum; size 300 mum; space charge distribution; space charge migration; transient external current; Breakdown voltage; Charge measurement; Current measurement; Distortion measurement; Electrodes; Rubber; Sheet materials; Space charge; Testing; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
  • Conference_Location
    Mie
  • Print_ISBN
    978-4-88686-005-7
  • Electronic_ISBN
    978-4-88686-006-4
  • Type

    conf

  • DOI
    10.1109/ISEIM.2008.4664513
  • Filename
    4664513