DocumentCode
3258713
Title
Anti-reflection structures fabricated by direct laser interference technology under different ambiances
Author
Dapeng Wang ; Yong Yue ; Ziang Zhang ; Dayou Li ; Maple, Carsten ; Zuobin Wang
Author_Institution
JR3CN & IRAC, Univ. of Bedfordshire, Luton, UK
fYear
2013
fDate
26-30 Aug. 2013
Firstpage
82
Lastpage
85
Abstract
In this paper, we take the strategy of direct laser interference technology to modify the silicon surface under air and sulphur hexafluoride (SF6) gas ambiance conditions. With the investigation of optical properties, the silicon spike structures (known as black silicon) which were fabricated in the SF6 ambiance showed the excellent ability of reducing light reflection with a broadband spectrum. For comparison, well-defined microcone structures were fabricated in the air ambiance. After hydrofluoric (HF) acid wiping off the oxides on the surface, micro cone structures have shown the anti-reflection function as well and its reflective behaviour was dependent on the structural depth relatively. Due to a high impurities concentration of spike structures obtained in the SF6 ambiance, applications of sulphur-doped black silicon would be limited. To obtain large-scale uniform structures, direct laser interference technology in the air ambiance could be an alternative.
Keywords
antireflection coatings; elemental semiconductors; impurities; laser materials processing; light reflection; silicon; Si; air ambiance conditions; antireflection structures; black silicon; broadband spectrum; direct laser interference technology; hydrofluoric acid; impurities concentration; light reflection reduction; microcone structures; optical properties; silicon spike structures; silicon surface; structural depth; sulphur hexafluoride gas ambiance conditions; Interference; Laser theory; Measurement by laser beam; Reflection; Silicon; Sulfur hexafluoride; anti-reflection structures; black silicon; direct laser interference technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
Conference_Location
Suzhou
Print_ISBN
978-1-4799-1210-0
Type
conf
DOI
10.1109/3M-NANO.2013.6737388
Filename
6737388
Link To Document