• DocumentCode
    3258727
  • Title

    Simulating lossy interconnect with high frequency nonidealities in linear time

  • Author

    Roychowdhury, Jaijeet S. ; Newton, A. Richard ; Pederson, Donald O.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1992
  • fDate
    8-12 Jun 1992
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    A linear time simulation technique is described in which each impulse response of frequency-varying lines is decomposed into two terms, with widely separated rates of decay. One term corresponds to a simple lossy line while the other represents the contribution of the high frequency nonideality. The latter term can decay to insignificant levels in an interval much shorter than simulation times of interest, making truncation possible and leading to computation in linear time. The former term usually decays over much longer intervals, so truncation is not generally feasible. However, this term is also computed in linear time by a recursive procedure that involves no approximation of impulse responses. Experimental results verified the linear complexity of the new technique and demonstrated the computational advantage for simulations of five or more cycles, with speedups of more than 10 times for long simulations
  • Keywords
    circuit analysis computing; losses; nonlinear network analysis; transient response; transmission lines; frequency-varying lines; high frequency nonidealities; impulse response; linear complexity; linear time; linear time simulation; lossy interconnect; simple lossy line; Circuit simulation; Computational modeling; Computer simulation; Convolution; Distributed parameter circuits; Frequency; High performance computing; Integrated circuit interconnections; Power system transients; Skin effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-2822-7
  • Type

    conf

  • DOI
    10.1109/DAC.1992.227858
  • Filename
    227858