• DocumentCode
    3258807
  • Title

    Growth of porous InP: Transition from three to two dimensional structures

  • Author

    Zhankun Weng ; An´gang Yuan ; Weixun Mi ; Wendan Zhang ; Cuiting Wu ; Zuobin Wang

  • Author_Institution
    Centre for Nano Metrol. & Manuf. Technol., Changchun Univ. of Sci. & Technol., Changchun, China
  • fYear
    2013
  • fDate
    26-30 Aug. 2013
  • Firstpage
    393
  • Lastpage
    396
  • Abstract
    We present the transition state of porous InP from three to two dimensions, which is explored during electrochemical etching at constant current density in NaCl solutions on n-InP(100) wafers. The `node´ of the three dimensional structure revealed by scanning electron microscopy are consistent with the oscillatory periods, and that the smooth curve is corresponding to the uniformly vertical pores along with the <;001> direction. In addition, the onset and end of the oscillations shift ahead of times with increasing current densities. Furthermore, the transition of porous InP was discussed based on the surface curvature, the diffusion-control, and the reactive heat.
  • Keywords
    III-V semiconductors; current density; electrochemistry; etching; indium compounds; porous semiconductors; scanning electron microscopy; semiconductor growth; surface diffusion; surface structure; <;001> direction; InP; current density; diffusion-control; electrochemical etching; n-InP(100) wafers; oscillation shift; oscillatory periods; porous material; reactive heat; scanning electron microscopy; surface curvature; three-dimensional structure; transition state; Correlation; Current density; Etching; Indium phosphide; Oscillators; Scanning electron microscopy; Three-dimensional displays; Electrochemical etching; Oscillatory behavior; Porous InP; Transition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
  • Conference_Location
    Suzhou
  • Print_ISBN
    978-1-4799-1210-0
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2013.6737393
  • Filename
    6737393