• DocumentCode
    3258970
  • Title

    Automated mechanical characterization of 2D materials using SEM based visual servoing

  • Author

    Zimmermann, S. ; Tiemerding, Tobias ; Fatikow, Sergej ; Wang, W. ; Li, Tong ; Wang, Yannan

  • Author_Institution
    Div. Microrobotics & Control Eng., Univ. of Oldenburg, Oldenburg, Germany
  • fYear
    2013
  • fDate
    26-30 Aug. 2013
  • Firstpage
    9
  • Lastpage
    14
  • Abstract
    This paper presents an automated handling approach of two-dimensional nanomaterials using a robotic setup inside a high-resolution scanning electron microscope. Applying image processing of the visual feedback provided by the electron microscope, a fully automated sequence is developed to align a robotic driven force sensor with sub micrometer accuracy and to conduct nanoindentation measurements on a periodically perforated substrate. As an example, this automated sequence is utilized to examine the mechanical properties of a few-layer graphene membrane. The results of the mechanical characterization are compared to Raman spectroscopy data. The paper discusses the advantages and restrictions of this technique and responds to further application scenarios.
  • Keywords
    force sensors; graphene; materials handling; membranes; microrobots; nanoindentation; nanostructured materials; robot vision; scanning electron microscopy; visual servoing; 2D materials; C; SEM based visual servoing; automated handling approach; automated mechanical characterization; automated sequence; few-layer graphene membrane; high-resolution scanning electron microscope; image processing; mechanical properties; nanoindentation measurements; periodically perforated substrate; robotic driven force sensor; robotic setup; submicrometer accuracy; two-dimensional nanomaterials; visual feedback; Automation; Graphene; Robots; Scanning electron microscopy; Substrates; 2D nanomaterials; automation; nanorobotic; visual servoing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
  • Conference_Location
    Suzhou
  • Print_ISBN
    978-1-4799-1210-0
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2013.6737400
  • Filename
    6737400