DocumentCode :
3258970
Title :
Automated mechanical characterization of 2D materials using SEM based visual servoing
Author :
Zimmermann, S. ; Tiemerding, Tobias ; Fatikow, Sergej ; Wang, W. ; Li, Tong ; Wang, Yannan
Author_Institution :
Div. Microrobotics & Control Eng., Univ. of Oldenburg, Oldenburg, Germany
fYear :
2013
fDate :
26-30 Aug. 2013
Firstpage :
9
Lastpage :
14
Abstract :
This paper presents an automated handling approach of two-dimensional nanomaterials using a robotic setup inside a high-resolution scanning electron microscope. Applying image processing of the visual feedback provided by the electron microscope, a fully automated sequence is developed to align a robotic driven force sensor with sub micrometer accuracy and to conduct nanoindentation measurements on a periodically perforated substrate. As an example, this automated sequence is utilized to examine the mechanical properties of a few-layer graphene membrane. The results of the mechanical characterization are compared to Raman spectroscopy data. The paper discusses the advantages and restrictions of this technique and responds to further application scenarios.
Keywords :
force sensors; graphene; materials handling; membranes; microrobots; nanoindentation; nanostructured materials; robot vision; scanning electron microscopy; visual servoing; 2D materials; C; SEM based visual servoing; automated handling approach; automated mechanical characterization; automated sequence; few-layer graphene membrane; high-resolution scanning electron microscope; image processing; mechanical properties; nanoindentation measurements; periodically perforated substrate; robotic driven force sensor; robotic setup; submicrometer accuracy; two-dimensional nanomaterials; visual feedback; Automation; Graphene; Robots; Scanning electron microscopy; Substrates; 2D nanomaterials; automation; nanorobotic; visual servoing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
Conference_Location :
Suzhou
Print_ISBN :
978-1-4799-1210-0
Type :
conf
DOI :
10.1109/3M-NANO.2013.6737400
Filename :
6737400
Link To Document :
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