Title :
Maximum current estimation in CMOS circuits
Author :
Kriplani, Harish ; Najm, Farid ; Hajj, Ibrahim
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
The authors propose pattern-independent, linear-time algorithms that provide tight upper bounds on maximum envelope current (MEC) waveforms. The proposed approach represents a trade-off between execution speed and tightness of these bounds. The MEC waveform is a point-wise maximum on all the possible waveforms that the circuit can draw. Experimental results on several benchmark circuits are provided to establish the usefulness of this approach
Keywords :
CMOS integrated circuits; VLSI; circuit analysis computing; integrated circuit testing; CMOS circuits; VLSI; benchmark circuits; linear-time algorithms; maximum current estimation; maximum envelope current; point-wise maximum; tight upper bounds; Circuits; Current supplies; Degradation; Design engineering; Laboratories; Power engineering and energy; Power engineering computing; Power supplies; Process design; Voltage;
Conference_Titel :
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-8186-2822-7
DOI :
10.1109/DAC.1992.227873
