• DocumentCode
    3259244
  • Title

    A frequency selection scheme for increased imaging speed in ECT

  • Author

    Fan, Zhaoyan ; Gao, Robert X.

  • Author_Institution
    Dept. of Mech. Eng., Univ. of Connecticut, Storrs, CT, USA
  • fYear
    2012
  • fDate
    16-17 July 2012
  • Firstpage
    616
  • Lastpage
    621
  • Abstract
    Electrical Capacitance Tomography (ECT) is a method to determine the material distribution within the interior of a closed object by measuring the capacitance values across externally mounted electrodes. Traditionally, an AC excitation pulse is applied to a pair of electrodes that form a capacitor during each measurement step, in order to determine the capacitance from the output current measured. This paper investigates how the speed of inter-electrode capacitance measurement can be improved by applying and receiving multiple excitation signals simultaneously on multiple electrodes. An excitation frequency selection scheme is derived to discuss the effect of bandwidth on the interference between the simultaneously sampled measurement channels. The new scheme opens up new possibilities for ECT as an effective tool for online, real-time monitoring of a wide range of dynamical processes.
  • Keywords
    capacitance measurement; capacitors; computerised monitoring; electric impedance imaging; interference suppression; AC excitation pulse; ECT; capacitor; dynamical process; electrical capacitance tomography; frequency selection scheme; interelectrode capacitance measurement; interference; material distribution; real-time monitoring; sampled measurement channel; Capacitance; Capacitance measurement; Electrodes; Electronic countermeasures; Frequency measurement; Materials; Voltage measurement; Electrical capacitance tomography; image reconstruction; permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
  • Conference_Location
    Manchester
  • Print_ISBN
    978-1-4577-1776-5
  • Type

    conf

  • DOI
    10.1109/IST.2012.6295558
  • Filename
    6295558