Title :
A study of integrated circuit I-V characteristics using a fault localization system [FLS]
Author :
Quah, L.T.S. ; Wong, W.K. ; Phang, J.C.H. ; Chan, D.S.H. ; Ho, P.Y.S.
Author_Institution :
Fac. of Eng., Nat. Univ. of Singapore, Singapore
fDate :
27 Nov-1 Dec 1995
Abstract :
A computer-controlled Fault Localization System [FLS] is used to investigate the variations of the I-V characteristics for different devices in terms of various criteria such as the area under the I-V characteristics, the area error and range error between a test device and a golden device. The use of the FLS in locating is also discussed
Keywords :
automatic testing; characteristics measurement; electrostatic discharge; failure analysis; fault diagnosis; integrated circuit measurement; integrated circuit testing; ESD failures; I-V characteristics; IC failure analysis; automatic testing; fault localization system; golden device; range error; test device; Application specific integrated circuits; CMOS technology; Circuit faults; Circuit testing; Computer errors; Electrostatic discharge; Failure analysis; Integrated circuit testing; Pins; Switches;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 1995., Proceedings of the 1995 5th International Symposium on the
Print_ISBN :
0-7803-2797-7
DOI :
10.1109/IPFA.1995.487599
