DocumentCode
3259445
Title
A self-calibration procedure for a sinusoidal fringe profilometer
Author
Bevilacqua, Maurizio ; Landi, Marco ; Paolillo, Alfredo
Author_Institution
Dept. of Ind. Eng., Univ. of Salerno, Fisciano, Italy
fYear
2012
fDate
16-17 July 2012
Firstpage
381
Lastpage
386
Abstract
The paper describes a calibration procedure for a structured-light sinusoidal-fringe profilometer which requires the acquisition of images of a plane in one or more unknown poses when it is illuminated by sinusoidal fringe patterns projected by an illuminator. The procedure does not require specific target but only a planar surface which can be freely moved or rotated around a vertical axis.
Keywords
calibration; image processing; surface topography measurement; image acquisition; planar surface; self-calibration procedure; structured light sinusoidal fringe profilometer; vertical axis; Calibration; Cameras; Mathematical model; Optimization; Periodic structures; Phase measurement; 3-D reconstruction; camera calibration; profilometry; projector; spatial phase; structured-light scanner; surface measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location
Manchester
Print_ISBN
978-1-4577-1776-5
Type
conf
DOI
10.1109/IST.2012.6295568
Filename
6295568
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