Title :
A self-calibration procedure for a sinusoidal fringe profilometer
Author :
Bevilacqua, Maurizio ; Landi, Marco ; Paolillo, Alfredo
Author_Institution :
Dept. of Ind. Eng., Univ. of Salerno, Fisciano, Italy
Abstract :
The paper describes a calibration procedure for a structured-light sinusoidal-fringe profilometer which requires the acquisition of images of a plane in one or more unknown poses when it is illuminated by sinusoidal fringe patterns projected by an illuminator. The procedure does not require specific target but only a planar surface which can be freely moved or rotated around a vertical axis.
Keywords :
calibration; image processing; surface topography measurement; image acquisition; planar surface; self-calibration procedure; structured light sinusoidal fringe profilometer; vertical axis; Calibration; Cameras; Mathematical model; Optimization; Periodic structures; Phase measurement; 3-D reconstruction; camera calibration; profilometry; projector; spatial phase; structured-light scanner; surface measurement;
Conference_Titel :
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location :
Manchester
Print_ISBN :
978-1-4577-1776-5
DOI :
10.1109/IST.2012.6295568
