• DocumentCode
    3259614
  • Title

    Preparation and evaluation of phthalocyanine/vanadium oxide field-effect transistors

  • Author

    Takatsuka, Y. ; Kitamura, S. ; Akazawa, T. ; Takahashi, T. ; Minagawa, M. ; Ohdaira, Y. ; Baba, A. ; Shinbo, K. ; Kato, K. ; Kaneko, F.

  • Author_Institution
    Grad. Sch. of Sci. & Technol., Niigata Univ., Niigata
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    Field-effect transistors were prepared with magnesium phthalocyanine (MgPc) and vanadium pentoxide (V2O5). Vapor treatments of several organic solvents were carried out for MgPc thin films. The UV-vis absorption spectra, surface morphologies, X-ray diffraction patterns were largely changed with the treatments. The FET characteristics were also improved by the treatments and dichloromethane treatment induced the largest improvement. Furthermore, V2O5 film, which is used as carrier generation layer in organic light-emitting diodes, were inserted in the FET and the FET characteristic was changed. The vapor treatment and V2O5 insertion should be used for controlling FET performance.
  • Keywords
    X-ray diffraction; field effect transistors; light emitting diodes; surface morphology; thin films; vanadium compounds; MgPc thin films; UV-vis absorption spectra; V2O5; X-ray diffraction patterns; dichloromethane treatment; magnesium phthalocyanine; organic light-emitting diodes; phthalocyanine-vanadium oxide field-effect transistors; surface morphologies; vanadium pentoxide; vapor treatment; Character generation; Electromagnetic wave absorption; FETs; Magnesium; Organic light emitting diodes; Solvents; Surface morphology; Surface treatment; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
  • Conference_Location
    Mie
  • Print_ISBN
    978-4-88686-005-7
  • Electronic_ISBN
    978-4-88686-006-4
  • Type

    conf

  • DOI
    10.1109/ISEIM.2008.4664571
  • Filename
    4664571