DocumentCode :
3259651
Title :
Electrical trees in inner and outer layer of different voltage rating XLPE cable insulation
Author :
Xie, A.S. ; Zheng, X.Q. ; Li, S.T.
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an
fYear :
2008
fDate :
7-11 Sept. 2008
Firstpage :
380
Lastpage :
383
Abstract :
The statistical initiation and propagation characteristics of electrical trees in cross linked polyethylene cables with different voltage rating from 66 kV to 500 kV were investigated, under a constant test voltage of 50 Hz/7 kV. It was found that the characteristics of electrical trees in inner layer of 66 kV cable insulation differed greatly from that in outer layer under the same test condition; however, few differences appeared as to 110 kV and above voltage rating cables. Through X-ray diffraction, differential scanning calorimetry and thermogravimetry method, it was suggested that besides extrusion process, molecular weight of base polymer material and its distribution are the prime factors deciding crystallization state, while the crystallization state and impurity content are responsible for the resistivity to electrical trees. Finally, dense and small spherulites, high crystallinity, high purity level of base polymer material and super-clean production processes are the aims to develop higher voltage rating cables.
Keywords :
X-ray diffraction; XLPE insulation; differential scanning calorimetry; power cables; trees (electrical); X-ray diffraction; XLPE cable insulation; cross linked polyethylene cables; crystallization state; differential scanning calorimetry; electrical trees; polymer material; statistical initiation; super-clean production; thermogravimetry; voltage 66 kV to 500 kV; Cable insulation; Cables; Crystalline materials; Crystallization; Insulation testing; Polyethylene; Polymers; Trees - insulation; Voltage; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
Conference_Location :
Mie
Print_ISBN :
978-4-88686-005-7
Electronic_ISBN :
978-4-88686-006-4
Type :
conf
DOI :
10.1109/ISEIM.2008.4664573
Filename :
4664573
Link To Document :
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