DocumentCode :
3259690
Title :
Discovering Manufacturing Process from Timed Data: the BJT4R Algorithm
Author :
Nabil, Benayadi ; Goc Marc, L. ; Philippe, Bouche
Author_Institution :
LSIS, Univ. Paul Cezanne, Marseille
fYear :
2006
fDate :
Dec. 2006
Firstpage :
242
Lastpage :
246
Abstract :
This paper addresses the problem of discovering and modeling a manufacturing process from the timed data contained in a monitoring data base. The modeling approach, called the stochastic approach, aims at producing temporal patterns under the form of abstract chronicle models from a homogenous Markov chain and its corresponding superposition of Poisson processes representing a sequence of timed data generated by supervision system. The paper presents the BJT4R algorithm (backward jump with timed constraints for road) that implements the stochastic approach to discover the most probable paths linking a discrete event class to another and its application to the wafer manufacturing process of a production plant of the STMicroelectronics Company. The aim of this application is to discover models of "manufacturing roads" with the associated timed constraints to improve the wafer manufacturing process. This paper shows that the stochastic approach and the BJT4R is applicable to this aim
Keywords :
Markov processes; data mining; manufacturing processes; BJT4R algorithm; Poisson processes superposition; STMicroelectronics Company; abstract chronicle models; homogenous Markov chain; manufacturing roads; monitoring data base; stochastic approach; supervision system; timed constraints; timed data; wafer manufacturing process; Algorithm design and analysis; Counting circuits; Data mining; Frequency; Large scale integration; Manufacturing processes; Production; Semiconductor device modeling; Stochastic processes; Viterbi algorithm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining Workshops, 2006. ICDM Workshops 2006. Sixth IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-2702-7
Type :
conf
DOI :
10.1109/ICDMW.2006.64
Filename :
4063632
Link To Document :
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