Title :
A study of the microcracks on the alumina of the thin-film head
Author :
Chekanov, A.S. ; Low, T.S. ; Alli, S.
Author_Institution :
Magnetic Technol. Centre, Nat. Univ. of Singapore, Singapore
fDate :
27 Nov-1 Dec 1995
Abstract :
A study of the microcracks found in the alumina of a magnetic thin film head is presented. The initiation and growth of the cracks was simulated. Thermal expansion of the energized wires was found to produce high stress at the pole tip area resulting in the cracks being attracted to the pole tips. Damages on the alumina act as crack initiation sites. The presence of a crack through the head gap also affects the recording performance of the head
Keywords :
alumina; magnetic heads; magnetic recording; magnetic thin film devices; microcracks; Al2O3; alumina; energized wires; magnetic thin film head; microcracks; pole tips; recording characteristics; stress; thermal expansion; Atomic force microscopy; Magnetic films; Magnetic force microscopy; Magnetic heads; Magnetic recording; Scanning electron microscopy; Thermal expansion; Thermal stresses; Transistors; Wires;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 1995., Proceedings of the 1995 5th International Symposium on the
Print_ISBN :
0-7803-2797-7
DOI :
10.1109/IPFA.1995.487619
