DocumentCode
3259842
Title
Parameter estimation from tomographic data using self-organising maps
Author
York, Trevor A. ; Ukpong, A. ; Mylvaganam, S. ; Yan Ru
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear
2012
fDate
16-17 July 2012
Firstpage
112
Lastpage
116
Abstract
The paper reports on the potential of using a type of artificial neural network, the self-organising map, for processing tomographic data from pipe separators to estimate interface levels. This is motivated by a desire to estimate process parameters without recourse to image reconstruction. Results show direct quantitative estimation of volume fraction of two-component flow mixtures containing oil and water from electrical capacitance tomography measurements. Parameter extraction from the trained feature map is realised using Gaussian mixture modelling. Parametric information of a mixture is determined by using the probability estimation of sample map and comparing the result with the model´s topology. The SOM Toolbox in MATLAB was used for training and developing the models. After preparing the training data the SOM mixture model can be trained in less than 20 seconds. 75% of the two-component mixture test samples are classified within 5% of the sample´s true composition.
Keywords
Gaussian processes; computerised tomography; liquid mixtures; pipes; self-organising feature maps; Gaussian mixture modelling; MATLAB; SOM mixture model; SOM toolbox; artificial neural network; direct quantitative volume fraction estimation; electrical capacitance tomography measurements; interface levels; oil; parameter estimation; parameter extraction; pipe separators; self-organising maps; tomographic data; two-component flow mixtures; water; Estimation; Materials; Neural networks; Tomography; Training; Uncertainty; Vectors; Gaussian mixture modeling; artificial neural network; electrical capacitance tomography; probability estimation of sample; self organising maps;
fLanguage
English
Publisher
ieee
Conference_Titel
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location
Manchester
Print_ISBN
978-1-4577-1776-5
Type
conf
DOI
10.1109/IST.2012.6295588
Filename
6295588
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