• DocumentCode
    3259875
  • Title

    A new method for studying the conduction mechanism of ZnO-based varistor ceramics

  • Author

    Li, S.T. ; Yang, Y. ; Zhang, L.

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xian Jiaotong Univ., Xian
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    384
  • Lastpage
    387
  • Abstract
    The I-V characteristics of ZnO-based varistor ceramics were investigated in a wide temperature range of 93 K-373 K. From the relationship between overall conductance and temperature, individual conductance component having different temperature dependence can be separated and analyzed. In addition, the equivalent circuits can be developed as well. As to ZnO-Bi2O3 system, the overall conductance is equivalent to three parts in series, due to ionic impurity scattering, neutral impurity scattering and optical scattering; as to ZnO-Bi2O3-MnO system, it comprises four parts in parallel series; for commercial ZnO-based varistor ceramics, it involves a thermionic emission component in parallel with a tunneling component. In commercial ZnO-based varistor ceramics, the calculated nonlinear coefficient corresponding to tunneling effect is as high as 33, which is close to the measured value of 43. Furthermore, it is found that the tunneling effect is active even in small current region, especially at low temperatures.
  • Keywords
    ceramics; electric admittance; thermionic emission; varistors; I-V characteristics; conductance component; conduction mechanism; ionic impurity scattering; neutral impurity scattering; optical scattering; temperature dependence; thermionic emission component; tunneling component; tunneling effect; varistor ceramics; Ceramics; Dielectrics and electrical insulation; Optical scattering; Temperature dependence; Temperature distribution; Temperature sensors; Tunneling; Varistors; Voltage; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
  • Conference_Location
    Mie
  • Print_ISBN
    978-4-88686-005-7
  • Electronic_ISBN
    978-4-88686-006-4
  • Type

    conf

  • DOI
    10.1109/ISEIM.2008.4664584
  • Filename
    4664584