DocumentCode
3259875
Title
A new method for studying the conduction mechanism of ZnO-based varistor ceramics
Author
Li, S.T. ; Yang, Y. ; Zhang, L.
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xian Jiaotong Univ., Xian
fYear
2008
fDate
7-11 Sept. 2008
Firstpage
384
Lastpage
387
Abstract
The I-V characteristics of ZnO-based varistor ceramics were investigated in a wide temperature range of 93 K-373 K. From the relationship between overall conductance and temperature, individual conductance component having different temperature dependence can be separated and analyzed. In addition, the equivalent circuits can be developed as well. As to ZnO-Bi2O3 system, the overall conductance is equivalent to three parts in series, due to ionic impurity scattering, neutral impurity scattering and optical scattering; as to ZnO-Bi2O3-MnO system, it comprises four parts in parallel series; for commercial ZnO-based varistor ceramics, it involves a thermionic emission component in parallel with a tunneling component. In commercial ZnO-based varistor ceramics, the calculated nonlinear coefficient corresponding to tunneling effect is as high as 33, which is close to the measured value of 43. Furthermore, it is found that the tunneling effect is active even in small current region, especially at low temperatures.
Keywords
ceramics; electric admittance; thermionic emission; varistors; I-V characteristics; conductance component; conduction mechanism; ionic impurity scattering; neutral impurity scattering; optical scattering; temperature dependence; thermionic emission component; tunneling component; tunneling effect; varistor ceramics; Ceramics; Dielectrics and electrical insulation; Optical scattering; Temperature dependence; Temperature distribution; Temperature sensors; Tunneling; Varistors; Voltage; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
Conference_Location
Mie
Print_ISBN
978-4-88686-005-7
Electronic_ISBN
978-4-88686-006-4
Type
conf
DOI
10.1109/ISEIM.2008.4664584
Filename
4664584
Link To Document