• DocumentCode
    3259900
  • Title

    Combined influence of substrate relief and mechanical compression on topographical evolution of surface wrinkling

  • Author

    Xiaoli Zhao ; Weiwei An ; Jiuchun Yan ; Liqin Wang

  • Author_Institution
    Sch. of Mechatron. Eng., Harbin Inst. of Technol., Harbin, China
  • fYear
    2013
  • fDate
    26-30 Aug. 2013
  • Firstpage
    343
  • Lastpage
    346
  • Abstract
    Controlled surface wrinkling could provide ordered and hierarchical structures in micro- and nano-meter scale. Here combined influence of out-of-plane compressive stress and in-plane substrate relief in Au/PDMS bilayer system was experimentally investigated to explore morphological evolution of surface wrinkling. Compared with single influence from out-of-plane compression or in-plane relief, the combined effect mainly reflected in two aspects: edge effect and rearrangement effect. Edge effect applied morphological change on the compressed fields near the edges, but patterns almost restored to the original shape after stress relaxation. Rearrangement effect made relaxed patterns on the rectangular convex regions to rearrange and led to the failure of shape memory effect. The results demonstrated that the combined effect could partly rearrange the original structures, which would be utilized to fabricate the complicated structures.
  • Keywords
    gold; polymers; shape memory effects; stress relaxation; surface topography; Au; hierarchical structures; in-plane substrate; mechanical compression; morphological properties; out-of-plane compressive stress; shape memory effect; stress relaxation; surface wrinkling; topographical analysis; Gold; Silicon; Stress; Substrates; Surface morphology; Surface topography; Surface treatment; compression; polydimethylsiloxane(PDMS); shape memory; wrinkling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
  • Conference_Location
    Suzhou
  • Print_ISBN
    978-1-4799-1210-0
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2013.6737446
  • Filename
    6737446