Title :
Recording experiments on rare-earth transition-metal thin films studied with Lorentz microscopy
Author :
Greldanus, F.J.A.M. ; Jacobs, B.A.J. ; Spruit, J.H.M. ; Klahn, S.
Author_Institution :
Philips Research Laboratories
Keywords :
Frequency; Magnetic force microscopy; Optical microscopy; Optical recording; Power lasers; Silicon; Temperature; Transistors; Transmission electron microscopy; Writing;
Conference_Titel :
Magnetics Conference, 1989. Digests of INTERMAG '89., International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTMAG.1989.690058
