Title :
A high-throughput low-power fully parallel 1024-bit 1/2 -rate low density parity check code decoder in 3D integrated circuits
Author :
Zhou, Lili ; Wakayama, Cherry ; Jangkrajarng, Nuttorn ; Hu, Bo ; Shi, C. J Richard
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
A 1024-bit, 1/2 -rate fully parallel low density parity check (LDPC) code decoder has been designed and implemented using a 3D 0.18μm fully depleted silicon-on-insulator (FDSOI) CMOS technology based on wafer bonding. The taped-out 3D decoder with about 8M transistors was simulated to have a high throughput of 2Gb/s and a low power consumption of only 430mW using 6.4μm by 6.3μm of die area. The 3D implementation is estimated to offer more than 10× power-delay-area product improvement over its corresponding 2D implementation. This first large-scale 3D ASIC with fine-grain (5μm) vertical interconnects is made possible by jointly developing a complete automated 3D design flow from a commercial 2D design flow combined with the needed 3D-design point tools.
Keywords :
CMOS integrated circuits; application specific integrated circuits; decoding; integrated circuit design; integrated circuit interconnections; parity check codes; silicon-on-insulator; wafer bonding; 0.18 micron; 1024 bit; 2 Gbit/s; 2D design flow; 3D ASIC; 3D decoder; 3D design flow; 3D integrated circuits; 430 mW; 5 micron; FDSOI CMOS technology; LDPC code decoder; fully depleted silicon-on-insulator technology; low density parity check code decoder; vertical interconnects; wafer bonding; CMOS technology; Circuit simulation; Decoding; Energy consumption; Integrated circuit technology; Parity check codes; Silicon on insulator technology; Three-dimensional integrated circuits; Throughput; Wafer bonding;
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN :
0-7803-9451-8
DOI :
10.1109/ASPDAC.2006.1594652