3260042

Advanced Layout Design For Deep-submicron Cmos Output Buffer With Higher Driving Capability And Better Esd Reliability

Ker, Ming-Dou ; Wu, Chung-Yu ; Chen, Tung-Yang

1997

3-5 June 1997

45

49

Assembly; CMOS process; CMOS technology; Communication industry; Computer industry; Electrostatic discharge; Fingers; MOS devices; Robustness; Very large scale integration;

English

ieee

VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on

Taipei, Taiwan

1524-766X

0-7803-4131-7

conf

10.1109/VTSA.1997.614724

614724