Title :
A built-in power supply noise probe for digital LSIs
Author :
Fukazawa, Mitsuya ; Noguchi, Koichiro ; Nagata, Makoto ; Taki, Kazuo
Author_Institution :
Dept. of Comput. & Syst. Eng., Kobe Univ., Japan
Abstract :
The design of compact noise detector circuitry that could be embedded and arrayed within a high-density large-scale digital circuit was demonstrated. In-depth characterization of dynamic power-supply and ground noises by the built-in noise detection technique can validate and/or calibrate dynamic power-supply analysis (IR drop) methodologies that are becoming requisite to nanometer scale digital integrated circuits.
Keywords :
digital integrated circuits; embedded systems; integrated circuit design; integrated circuit noise; large scale integration; logic design; power supply circuits; LSI; built-in noise detection technique; compact noise detector circuit; ground noises; nanometer scale digital integrated circuits; power supply analysis; power supply noise probe; Large scale integration; Power supplies; Probes;
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN :
0-7803-9451-8
DOI :
10.1109/ASPDAC.2006.1594659
