• DocumentCode
    3260492
  • Title

    Input Validation for Semi-supervised Clustering

  • Author

    Yip, Kevin Y. ; Ng, Michael K. ; Cheung, David W.

  • Author_Institution
    Dept. of Comput. Sci., Yale Univ., New Haven, CT
  • fYear
    2006
  • fDate
    Dec. 2006
  • Firstpage
    479
  • Lastpage
    483
  • Abstract
    Semi-supervised clustering is practical in situations in which there exists some domain knowledge that could help the clustering process, but which is not suitable or not sufficient for supervised learning. There have been a number of studies on semi-supervised clustering, but almost all of them assume the input knowledge is correct or largely correct. In this paper we show that even a small proportion of incorrect input knowledge could make a semi-supervised clustering algorithm perform worse than having no inputs. This is a real concern since in real applications it is reasonable to have problematic "knowledge inputs" that are wrong or inappropriate for the clustering task. We propose a general methodology for detecting potentially incorrect inputs and performing verifications. Based on the methodology, we outline some methods for validating the inputs of the semi-supervised clustering algorithm MPCK-Means. Experimental results show that the input validation step is both critical and effective as the clustering accuracy of MPCK-Means was lowered by incorrect inputs, but the lost accuracy was resumed when validation was performed
  • Keywords
    learning (artificial intelligence); pattern clustering; MPCK-Means; domain knowledge; incorrect input knowledge; input validation; semi supervised clustering; Clustering algorithms; Clustering methods; Computer science; Conferences; Data mining; Humans; Mathematics; Supervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining Workshops, 2006. ICDM Workshops 2006. Sixth IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7695-2702-7
  • Type

    conf

  • DOI
    10.1109/ICDMW.2006.101
  • Filename
    4063675