Title :
Electrothermal analysis and optimization techniques for nanoscale integrated circuits
Author :
Zhan, Yong ; Goplen, Brent ; Sapatnekar, Sachin S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN
Abstract :
With technology scaling, on-chip power densities are growing steadily, leading to the point where temperature has become an important consideration in the design of electrical circuits. This paper overviews several methods for the analysis and optimization of thermal effects in integrated circuits. Thermal analysis may be carried out efficiently through the use of finite difference methods, finite element methods, or Green function based methods, each of which provides different accuracy-computation tradeoffs, and the paper begins by surveying these. Next, we overview a restricted set of thermal optimization methods, specifically, placement techniques for thermal heat-spreading, and then we conclude by summarizing a set of future directions in electrothermal design
Keywords :
Green´s function methods; finite difference methods; finite element analysis; integrated circuit design; nanoelectronics; thermal analysis; Green function based methods; accuracy-computation tradeoffs; electrical circuit design; electrothermal analysis; electrothermal design; finite difference methods; finite element methods; nanoscale integrated circuits; on-chip power densities; technology scaling; thermal effects; thermal heat-spreading; thermal optimization methods; Circuit analysis; Delay effects; Electrothermal effects; Heat sinks; Integrated circuit modeling; Integrated circuit packaging; Optimization methods; Temperature distribution; Temperature sensors; Thermal conductivity;
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Conference_Location :
Yokohama
Print_ISBN :
0-7803-9451-8
DOI :
10.1109/ASPDAC.2006.1594685