DocumentCode
3260568
Title
Electrothermal analysis and optimization techniques for nanoscale integrated circuits
Author
Zhan, Yong ; Goplen, Brent ; Sapatnekar, Sachin S.
Author_Institution
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN
fYear
2006
fDate
24-27 Jan. 2006
Abstract
With technology scaling, on-chip power densities are growing steadily, leading to the point where temperature has become an important consideration in the design of electrical circuits. This paper overviews several methods for the analysis and optimization of thermal effects in integrated circuits. Thermal analysis may be carried out efficiently through the use of finite difference methods, finite element methods, or Green function based methods, each of which provides different accuracy-computation tradeoffs, and the paper begins by surveying these. Next, we overview a restricted set of thermal optimization methods, specifically, placement techniques for thermal heat-spreading, and then we conclude by summarizing a set of future directions in electrothermal design
Keywords
Green´s function methods; finite difference methods; finite element analysis; integrated circuit design; nanoelectronics; thermal analysis; Green function based methods; accuracy-computation tradeoffs; electrical circuit design; electrothermal analysis; electrothermal design; finite difference methods; finite element methods; nanoscale integrated circuits; on-chip power densities; technology scaling; thermal effects; thermal heat-spreading; thermal optimization methods; Circuit analysis; Delay effects; Electrothermal effects; Heat sinks; Integrated circuit modeling; Integrated circuit packaging; Optimization methods; Temperature distribution; Temperature sensors; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 2006. Asia and South Pacific Conference on
Conference_Location
Yokohama
Print_ISBN
0-7803-9451-8
Type
conf
DOI
10.1109/ASPDAC.2006.1594685
Filename
1594685
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