Title :
Localization of faulty operators on an ASIC by the use of a laser beam
Author :
Bouvet, C. ; Fouillat, P. ; Dom, J.P.
Author_Institution :
IXL, Bordeaux I Univ., Talence, France
Abstract :
A powerful testing method consists in using two complementary techniques for ASIC´s failure localization and analysis: external electrical testing and internal contactless laser beam testing. This method has been made possible using the CAD environment. It provides test vectors and simulation results for the electrical external tester and ASIC layout for the internal contactless laser beam tester. The use of a laser beam integrated in automatic test equipment allows the authors to determine the logic state of any operator in the ASIC. The method is based upon the photoelectric effect generated in the laser beam-silicon interaction
Keywords :
application specific integrated circuits; automatic test equipment; automatic testing; failure analysis; fault location; integrated circuit testing; integrated logic circuits; logic testing; measurement by laser beam; ASIC; CAD environment; automatic test equipment; failure localization; faulty operator localization; internal contactless testing; laser beam; logic state; photoelectric effect; test vectors; testing method; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Contacts; Costs; Integrated circuit testing; Laser beams; Laser modes; MOSFETs;
Conference_Titel :
Euro ASIC '92, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-2845-6
DOI :
10.1109/EUASIC.1992.227987
