Title :
2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings (IEEE Cat. No.04EX862)
Abstract :
The following topics are dealt with: advanced CMOS devices; RF/analog devices; silicon nano devices; SOI devices; power devices; gate dielectrics; advanced shallow junction and silicide technology; advanced interconnect technology; advanced process technology; nanotube technology and tunnelling devices; logic/memory technology; quantum devices and nanotechnology; reliability; compact device modelling; device simulation; interconnect modelling and process simulation; modelling and characterization of RF/mixed signal applications; RF/analog integrated circuits; SOC/SIP technology; digital integrated circuits; sensors and MEMS; RF/magnetic/temperature/gas MEMS; bio/inertial/pressure/flow MEMS; micro/nano MEMS fabrication process and actuators; EDA/CAD technology; display and optical devices; IC verification/testing; SiGe/Si materials and devices; SOI materials and thin film technologies and compound semiconductor devices and circuits.
Keywords :
CMOS integrated circuits; electronic design automation; integrated circuit testing; logic devices; micromechanical devices; mixed analogue-digital integrated circuits; nanoelectronics; semiconductor technology; sensors; silicon-on-insulator; system-on-chip; thin film devices; EDA/CAD technology; IC verification/testing; RF/analog devices; RF/analog integrated circuits; RF/magnetic/temperature/gas MEMS; RF/mixed signal; SOC/SIP technology; SOI devices; SOI materials; SiGe/Si materials; advanced CMOS devices; advanced interconnect technology; advanced process technology; advanced shallow junction; bio/inertial/pressure/flow MEMS; compact device modelling; compound semiconductor devices; device simulation; digital integrated circuits; display devices; gate dielectrics; interconnect modelling; logic/memory technology; micro/nano MEMS fabrication process; nanotechnology; nanotube technology; optical devices; power devices; process simulation; quantum devices; reliability; silicide technology; silicon nano devices; thin film technologies; tunnelling devices;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1434932
