DocumentCode :
3261049
Title :
Delay variation tolerance for domino circuits
Author :
Wu, Kai-Chiang ; Hsieh, Cheng-Tao ; Chang, Shih-Chieh
Author_Institution :
Dept. of CS, Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2006
fDate :
24-27 Jan. 2006
Abstract :
Factors of delay variation, such as process variation and noise effects, may cause a manufactured chip to violate the pre-specified timing constraint. In this paper, we propose a re-synthesis technique to tolerate delay variation for domino circuits. Note that the slacks of nodes along critical paths are zero; any delay addition to those zero-slack nodes worsens the final performance of a circuit. Our basic idea is to increase the slacks of nodes in the critical region by appending a redundant auxiliary subcircuit to the original circuit. The auxiliary subcircuit can cause critical paths to become false paths or imperceptible paths as stated in S. Raj et al. (2004) so as to improve the capability of delay variation tolerance. Experimental results are very encouraging.
Keywords :
delays; fault tolerance; logic circuits; logic design; auxiliary subcircuit; critical paths; delay variation tolerance; domino circuits; false paths; imperceptible paths; noise effects; process variation; re-synthesis technique; timing constraint; zero-slack nodes; Added delay; Circuit noise; Delay effects; Feeds; Logic functions; Manufacturing processes; Redundancy; Timing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN :
0-7803-9451-8
Type :
conf
DOI :
10.1109/ASPDAC.2006.1594708
Filename :
1594708
Link To Document :
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