Title :
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
Author :
Li, Katherine Shu-Min ; Chang, Yao-Wen ; Su, Chauchin ; Lee, Chung-Len ; Chen, Jwu E.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
We propose an interconnect diagnosis scheme based on oscillation ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.
Keywords :
crosstalk; delays; fault diagnosis; integrated circuit interconnections; integrated circuit testing; system-on-chip; IEEE standard 1500; SOC design; crosstalk faults; crosstalk glitches; delay faults; diagnosis ring generation; fast diagnosability checking; fault models; interconnect diagnosis; optimal diagnosability; optimal diagnosis; oscillation ring test; Algorithm design and analysis; Circuit faults; Circuit testing; Crosstalk; Delay; Design engineering; Electrical fault detection; Electronic equipment testing; Fault diagnosis; Integrated circuit interconnections;
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN :
0-7803-9451-8
DOI :
10.1109/ASPDAC.2006.1594710