• DocumentCode
    3261154
  • Title

    Optimal topology exploration for application-specific 3D architectures

  • Author

    Ozturk, Ozcan ; Wang, Feng ; Kandemir, Mahmut ; Xie, Yuan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA
  • fYear
    2006
  • fDate
    24-27 Jan. 2006
  • Abstract
    As technology scales, increasing interconnect costs make it necessary to consider alternate ways of building integrated circuits. One promising option along this direction is 3D architectures where a stack of multiple device layers, with direct vertical tunneling through them, are put together on the same chip. In this paper, we explore how processor cores and storage blocks can be placed in a 3D architecture to minimize data access costs under temperature constraints. This process is referred to as the topology exploration. Using integer linear programming, we compare the best 2D placement with the best 3D placement, and show through experiments with both single-core and multicore systems that the 3D placement generates much better results (in terms of data access costs) under the same temperature bounds. We also discuss the tradeoffs between temperature constraint and data access costs
  • Keywords
    application specific integrated circuits; electronic design automation; integer programming; integrated circuit layout; linear programming; application-specific 3D architectures; best 2D placement; best 3D placement; data access costs; direct vertical tunneling; integer linear programming; interconnect costs; multicore systems; optimal topology exploration; processor cores; single-core system; storage blocks; temperature constraints; CMOS technology; Computer architecture; Costs; Data communication; Integer linear programming; Integrated circuit interconnections; Integrated circuit technology; Temperature; Topology; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 2006. Asia and South Pacific Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    0-7803-9451-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2006.1594714
  • Filename
    1594714