• DocumentCode
    3261320
  • Title

    Future of Nano CMOS Technology

  • Author

    Iwai, Hiroshi

  • Author_Institution
    Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259, Nagatsuta-cho, Midori-ku, Yokohama, 226-8502. Phone: +81-(45) 924-5471. Fax: +81-(45) 924-5584. Email: h.iwai@ieee.org
  • fYear
    2007
  • fDate
    3-4 June 2007
  • Firstpage
    57
  • Lastpage
    61
  • Abstract
    CMOS technology has been developed into the sub-100 nm range. It is expected that the nano-CMOS technology will governed the IC manufacturing for at least another couple of decades. Though there are many challenges ahead, further down-sizing the device to a few nanometers is still on the schedule of International Technology Roadmap for Semiconductors (ITRS). Several technological options for manufacturing nano-CMOS microchips have been available or will soon be available. This paper reviews the challenges of nano-CMOS downsizing and manufacturing. We shall focus on the recent progress on the key technologies for the nano-CMOS IC fabrication in the next fifteen years.
  • Keywords
    CMOS technology; Humans; Insulation; Integrated circuit technology; Large scale integration; Power generation economics; Production; Random access memory; Semiconductor device manufacture; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
  • Conference_Location
    Tsinghua University
  • Print_ISBN
    1-4244-1098-3
  • Electronic_ISBN
    1-4244-1098-3
  • Type

    conf

  • DOI
    10.1109/EDST.2007.4289777
  • Filename
    4289777