• DocumentCode
    3261436
  • Title

    Integrating ASIC and board design-for-testability

  • Author

    Kraak, Michiel

  • Author_Institution
    Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands
  • fYear
    1992
  • fDate
    1-5 Jun 1992
  • Firstpage
    178
  • Lastpage
    183
  • Abstract
    The author presents the knowledge-based system WAGNER that integrates the application of design-for-test ability methods for boards, ASICs and boards containing ASICs. The system adapts the design to testing by using expert DFT knowledge and heuristics stored in a rule-based called TRISTAN and ISOLDE. TRISTAN (TRI-Stage Testability ANalysis) qualitatively analyzes the testability of a circuit uniformly over the complete design hierarchy. It recognizes three design levels, i.e. the functional level, called block level, the RT or module level and the logic level. ISOLDE (Intelligent Synthesis Of testabLe DEsigns) synthesizes testability features on the basis of TRISTAN´s analysis results at each design level, selecting the most appropriate feature. A prototype implementation of the system in PROLOG has been evaluated for several designs, showing the approach is feasible for automated testable design
  • Keywords
    application specific integrated circuits; circuit CAD; design for testability; digital integrated circuits; integrated circuit testing; knowledge based systems; logic CAD; logic testing; printed circuit design; printed circuit testing; ASIC; ISOLDE; PCB; PROLOG; TRISTAN; WAGNER; automated testable design; block level; design-for-testability; digital board design; expert DFT knowledge; functional level; knowledge-based system; logic level; module level; rule-based; Amplitude shift keying; Application specific integrated circuits; Circuit synthesis; Circuit testing; Design for testability; Design methodology; Knowledge based systems; Logic design; Logic testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Euro ASIC '92, Proceedings.
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-2845-6
  • Type

    conf

  • DOI
    10.1109/EUASIC.1992.228028
  • Filename
    228028