• DocumentCode
    3261569
  • Title

    Adaptive admittance-based conductor meshing for interconnect analysis

  • Author

    Yang, Ya-Chi ; Koh, Cheng-Kok ; Balakrishnan, Venkataramanan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    2006
  • fDate
    24-27 Jan. 2006
  • Abstract
    We present a new algorithm for discretizing interconnects, a step that is typically performed to account for the nonuniformity of current flow at high frequencies. The algorithm is based on an easily-computable measure that correlates well with the model accuracy. This measure is used to refine the discretization of interconnects in an adaptive scheme so as to systematically trade off computation against model accuracy. We apply the proposed discretization technique on two classes of problems in the analysis of VLSI interconnects: simulation and frequency-dependent inductance extraction. Numerical results establish that with the interconnect discretizations generated by our algorithm, a reduction in simulation and extraction times by a factor between three and seven can be realized with negligible sacrifice in model accuracy (<1% error)
  • Keywords
    VLSI; integrated circuit interconnections; VLSI interconnect; adaptive admittance-based conductor meshing; current flow nonuniformity; frequency-dependent inductance extraction; interconnect analysis; interconnect discretization; Analytical models; Computational modeling; Conductors; Frequency; High performance computing; Inductance; Integrated circuit interconnections; Proximity effect; Skin; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 2006. Asia and South Pacific Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    0-7803-9451-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2006.1594736
  • Filename
    1594736