Title :
An efficient algorithm for 3D reluctance extraction considering high frequency effect
Author :
Zhang, Mengsheng ; Yu, Wenjian ; Du, Yu ; Wang, Zeyi
Author_Institution :
Dept. Comput. Sci. & Tech., Tsinghua Univ., Beijing
Abstract :
As shown in literatures, partial reluctance based circuit analysis is efficient in capturing on-chip inductance effect, because the partial reluctance exhibits much better locality than partial inductance. However, most previous works on reluctance extraction did not take high frequency effect into account and were not efficient enough for 3D complex structure. In this paper, a new reluctance extraction algorithm is proposed considering the high frequency effect. Numerical experiments demonstrate that our algorithm can handle complex 3D interconnect structures while exhibiting high accuracy and a speed-up ratio of several tens to hundreds over FastHenry
Keywords :
high-frequency effects; integrated circuit interconnections; integrated circuit modelling; 3D interconnect structures; 3D reluctance extraction; high frequency effects; on-chip inductance effect; partial reluctance based circuit analysis; Capacitance; Circuit analysis; Circuit simulation; Coupling circuits; Delay; Frequency; Impedance; Inductance; Integrated circuit interconnections; Very large scale integration;
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Conference_Location :
Yokohama
Print_ISBN :
0-7803-9451-8
DOI :
10.1109/ASPDAC.2006.1594738