DocumentCode :
3261793
Title :
Asynchronous circuits sensitivity to fault injection
Author :
Monnet, Y. ; Renaudin, M. ; Leveugle, R.
Author_Institution :
TIMA laboratory, Grenoble, France
fYear :
2004
fDate :
12-14 July 2004
Firstpage :
121
Lastpage :
126
Abstract :
This paper presents an analysis of the faults sensitivity of Quasi Delay Insensitive (QDI) asynchronous circuits. Faults considered in this work can be either natural or intentional. However, fault injection attacks which consist in causing an intentional temporary dysfunction of a circuit by injecting faults in its combinational or sequential parts are of prime interest. This failure enables hackers to access protected memory areas or secret information like cryptographic keys. This work focuses on analysing the sensitivity of asynchronous circuits to fault injection. A circuit fault-sensitivity criterion is defined, which enables to point out weak parts of the circuits in order to specify hardening strategies.
Keywords :
asynchronous circuits; fault simulation; logic testing; CAD tool; Muller gate; asynchronous circuits; circuit fault-sensitivity criterion; fault injection sensitivity; fault models; hardening strategies; quasi delay insensitive circuits; security properties; temporary dysfunction; Asynchronous circuits; Circuit faults; Clocks; Computer hacking; Cryptography; Delay; Laboratories; Protection; Protocols; Smart cards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
Print_ISBN :
0-7695-2180-0
Type :
conf
DOI :
10.1109/OLT.2004.1319669
Filename :
1319669
Link To Document :
بازگشت