Title :
A 1Gb/s silicon photo-receiver in standard CMOS for 850-nm optical communication
Author :
Huang, Beiju ; Zhang, Xu ; Liu, Haijun ; Liu, Jinbin ; Dai, Xiaoguang ; Zhang, Yu ; Chen, HongDa
Author_Institution :
State Key Laboratory, Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China. Email: bjhuang@semi.ac.cn
Abstract :
A monolithic silicon CMOS optoelectronic integrated circuit (OEIC) was designed and fabricated with standard 0.64¿m CMOS technology. This OEIC circuit consisted of an integrated double photodiode detector (DPD) and a preamplifier. The DPD detector exhibited high bandwidth by screening the bulk-generated diffusion carriers and suppressing the slow diffusion tail effect. The preamplifier exploited the regulated cascode (RGC) configuration as the input stage of receiver, thus isolating the influence of photodiode capacitance and input parasitic capacitance on bandwidth. Testing results showed that the bandwidth of OEIC was 700MHz, indicating the bit rate of 1Gb/s was achieved.
Keywords :
Bandwidth; CMOS technology; Communication standards; Detectors; Optical fiber communication; Optoelectronic devices; Parasitic capacitance; Photodiodes; Preamplifiers; Silicon; Complementary Metal-Oxide-Semiconductor (CMOS); Double Photodiode Detector (DPD); Transimpedance Amplifier (TIA); optical receivers;
Conference_Titel :
Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
Conference_Location :
Tsinghua University
Print_ISBN :
1-4244-1098-3
Electronic_ISBN :
1-4244-1098-3
DOI :
10.1109/EDST.2007.4289812