Title :
Curve fitting based test method for integrated circuit simulation
Author :
Dan, Song ; Xiaolin, Zhang
Author_Institution :
The School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing, 100083, China. Email: buaasd@ee.buaa.edu.cn
Abstract :
A test method for the integrated circuit(IC) simulation is presented. Perl language and OCEAN language were used in the simulation to generate automatically a group of adequate and accurate testing files. Thousands of long-playing simulations were accomplished as a batch from a nongraphic remote terminal. According to the vast simulation results, figures were drawn, line fitting was completed by the least square method, and useful information was extracted. The simulation shows that the solution could be much more efficient, effective, accurate and convenient.
Keywords :
Circuit simulation; Circuit testing; Curve fitting; Data mining; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Least squares methods; Oceans; Open source software; OCEAN; Perl; fitting; integrated circuit(IC); least square method; simulation;
Conference_Titel :
Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
Conference_Location :
Tsinghua University
Print_ISBN :
1-4244-1098-3
Electronic_ISBN :
1-4244-1098-3
DOI :
10.1109/EDST.2007.4289816
