A new boundary element method for accurate modeling of lossy substrates with arbitrary doping profiles

Author

Wang, Xiren ; Yu, Wenjian ; Wang, Zeyi

Author_Institution

Dept. Comput. Sci. & Technol., Tsinghua Univ., Beijing

fYear

2006

fDate

24-27 Jan. 2006

Abstract

It is important to model substrate couplings for SoC/mixed-signal circuit designs. After introducing the continuation equation of full current in lossy substrates, we present a new direct boundary element method (DBEM), which can handle the substrates with arbitrary doping profiles. Three techniques can speed up the DBEM remarkably, which include reusing coefficient matrices for multiple-frequency calculation, condensing the linear system, and sparsifying coefficient matrix. Numerical experiments illustrate that DBEM has high accuracy and high efficiency, and is versatile for arbitrary doping profiles

Keywords

boundary-elements methods; doping profiles; integrated circuit modelling; matrix algebra; substrates; DBEM; SoC/mixed-signal circuit designs; arbitrary doping profiles; coefficient matrix; direct boundary element method; linear system; lossy substrates; multiple-frequency calculation; substrate couplings; Acceleration; Boundary element methods; Circuits; Discrete cosine transforms; Doping profiles; Finite difference methods; Frequency; Impedance; Linear systems; Semiconductor process modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation, 2006. Asia and South Pacific Conference on

Conference_Location

Yokohama

Print_ISBN

0-7803-9451-8

Type

conf

DOI

10.1109/ASPDAC.2006.1594765

Filename

1594765