Title :
An intrinsically robust technique for fault tolerance under multiple upsets
Author :
Lisboa, C.A.L. ; Carro, Luigi
Author_Institution :
Departamento de Engenharia Eletrica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
In this study, the use of stochastic operators for the design of inherently robust circuits for future technologies is proposed, being an alternative to conventional digital arithmetic operators.
Keywords :
circuit reliability; combinational circuits; digital arithmetic; fault tolerance; logic design; stochastic processes; SEU; arithmetic stochastic operators; combinational circuits; digital arithmetic operators; fault tolerance; inherently robust circuits; microelectronics reliability; multiple upsets; soft errors; Circuit noise; Computer errors; Electromagnetic transients; Fault tolerance; Pulse circuits; Robustness; Semiconductor device noise; Single event transient; Stochastic processes; Stochastic resonance;
Conference_Titel :
On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
Print_ISBN :
0-7695-2180-0
DOI :
10.1109/OLT.2004.1319682
