• DocumentCode
    3262193
  • Title

    Yield-area optimizations of digital circuits using non-dominated sorting genetic algorithm (YOGA)

  • Author

    Agarwal, Vineet ; Wang, Janet

  • Author_Institution
    Electr. & Comput. Eng., Arizona Univ., Tucson, AZ
  • fYear
    2006
  • fDate
    24-27 Jan. 2006
  • Abstract
    With shrinking technology, the timing variation of a digital circuit is becoming the most important factor while designing a functionally reliable circuit. Gate sizing has emerged as one of the efficient way to subside the yield deterioration due to manufacturing variations. In the past single-objective optimization techniques have been used to optimize the timing variation whereas on the other hand multi-objective optimization techniques can provide a more promising approach to design the circuit. We propose a new algorithm called YOGA, based on multi-objective optimization technique called non-dominated sorting genetic algorithm (NSGA). YOGA optimizes a circuit in multi domains and provides the user with Pareto-optimal set of solutions which are distributed all over the optimal design spectrum, giving users the flexibility to choose the best fitting solution for their requirements. YOGA overcomes the disadvantages of traditional optimization techniques, while even providing solutions in very stringent bounds
  • Keywords
    Pareto optimisation; circuit optimisation; digital integrated circuits; genetic algorithms; integrated circuit yield; NSGA; Pareto optimisation; YOGA; digital integrated circuits; gate sizing; multi-objective optimization techniques; nondominated sorting genetic algorithm; optimal design spectrum; single-objective optimization techniques; yield-area optimizations; Constraint optimization; Design optimization; Digital circuits; Genetic algorithms; Genetic engineering; Manufacturing; Reliability engineering; Sorting; Timing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 2006. Asia and South Pacific Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    0-7803-9451-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2006.1594771
  • Filename
    1594771