DocumentCode :
32622
Title :
Low Energy Characterization of Caliste HD, a Fine Pitch CdTe-Based Imaging Spectrometer
Author :
Dubos, Sebastien ; Limousin, Olivier ; Blondel, Claire ; Chipaux, R. ; Dolgorouky, Youri ; Gevin, Olivier ; Menesguen, Yves ; Meuris, Aline ; Orduna, Thierry ; Tourette, Thierry ; Sauvageon, Aymeric
Author_Institution :
Astrophys. Div., CEA Saclay, Gif-sur-Yvette, France
Volume :
60
Issue :
5
fYear :
2013
fDate :
Oct. 2013
Firstpage :
3824
Lastpage :
3832
Abstract :
Caliste HD is a recently developed micro-camera designed for X and gamma-ray astronomy, based on a 1×1 cm2 CdTe Schottky pixelated detector. Its entire surface is composed of 256 pixels, disposed on a 16 × 16 pixel array. This spectrometer is buttable on its 4 sides and can be used to create a large focal plane. It is also designed for space environment. Its IDeF-X front-end electronics has low power consumption, excellent noise performance and a wide dynamic range, from 2 keV to 1 MeV. Moreover, electronic noise performances of this device were optimized to set the low level energy threshold lower than 2 keV.
Keywords :
II-VI semiconductors; Rutherford backscattering; X-ray imaging; X-ray spectrometers; cadmium compounds; cameras; platinum; semiconductor counters; Caliste HD; CdTe-Pt; IDeF-X front-end electronics; Rutherford backscattering spectroscopy; Schottky pixelated detector; X-ray astronomy; absorption layers; electron volt energy 2.2 keV to 11.6 keV; electronic noise performances; fine pitch CdTe-based imaging spectrometer; focal plane; gamma-ray astronomy; low energy characterization; low power consumption; microcamera; mono energetic X-ray beam; space environment; Absorption; Detectors; Energy measurement; Energy resolution; High definition video; Image edge detection; Photonics; Application specific integrated circuits; CdTe characterization; CdTe detectors; X-ray detectors; X-ray spectroscopy; astrophysics instrumentation, CdTe; charge sharing; front-end electronics; gamma-ray cameras; gamma-ray spectroscopy; instrumentation; semiconductor detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2281572
Filename :
6616028
Link To Document :
بازگشت