• DocumentCode
    3262215
  • Title

    A probabilistic analysis of pipelined global interconnect under process variations

  • Author

    Kankani, Navneeth ; Agarwal, Vineet ; Wang, Janet

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ
  • fYear
    2006
  • fDate
    24-27 Jan. 2006
  • Abstract
    The main thesis of this paper is to perform a reliability based performance analysis for a shared latch inserted global interconnect under uncertainty. We first put forward a novel delay metric named DMA for estimation of interconnect delay probability density function considering process variations. Without considerable loss in accuracy, DMA can achieve high computational efficiency even in a large space of random variables. We then propose a comprehensive probabilistic methodology for sampling transfers, on a shared latch inserted global interconnect, that highly improves the reliability of the interconnect. Improvements up to 125% are observed in the reliability when compared to deterministic sampling approach. It is also shown that dual phase clocking scheme for pipelined global interconnect is able to meet more stringent timing constraints due to its lower latency
  • Keywords
    integrated circuit interconnections; integrated circuit reliability; probability; sampling methods; DMA; delay metric; deterministic sampling approach; dual phase clocking scheme; interconnect delay; performance analysis; pipelined global interconnect; probabilistic analysis; probability density function; process variations; Bit error rate; Clocks; Delay estimation; Frequency; Performance analysis; Pipeline processing; Probability density function; Sampling methods; Timing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 2006. Asia and South Pacific Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    0-7803-9451-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2006.1594772
  • Filename
    1594772