Title :
A 0.13-/spl mu/m SOI CMOS technology for low-power digital and RF applications
Author :
Zamdmer, N. ; Ray, A. ; Plouchart, J.-O. ; Wagner, L. ; Fong, N. ; Jenkins, K.A. ; Jin, W. ; Smeys, P. ; Yang, I. ; Shahidi, G. ; Assaderghi, F.
Author_Institution :
Semicond. R&D Center, IBM Corp., Hopewell Junction, NY, USA
Abstract :
Battery-operated electronic devices that can communicate wirelessly are becoming more and more pervasive. This trend is enabled by technologies that allow low-power digital and RF processing. We present here a 0.13 /spl mu/m, partially-depleted SOI CMOS technology with optimized power-saving and RF properties. Power-saving features include low-V/sub t/, thin-gate-oxide FETs for minimum power dissipation and high performance at low voltage (25 ps inverter delay at 0.7 V V/sub dd/); high-V/sub t/, thick-gate-oxide FETs for low-standby-power SRAM and logic-block power switches; and eight levels of Cu interconnects with low-k ILD (Smeys et al., 2000). RF features include high peak NFET performance (141 GHz f/sub T/ and 98 GHz f/sub max/ at V/sub ds/=1.2 V) and the following group of high-Q passives: inductor (peak simulated differential Q of 50 at 4 GHz, L=0.65 nH), MOS varactor, MIMCAP, and resistors.
Keywords :
CMOS integrated circuits; MIM devices; MOSFET; SRAM chips; dielectric thin films; field effect MMIC; inductors; integrated circuit interconnections; integrated circuit measurement; integrated circuit metallisation; low-power electronics; permittivity; resistors; silicon-on-insulator; thin film capacitors; varactors; 0.13 micron; 0.7 V; 1.2 V; 141 GHz; 25 ps; 4 GHz; 98 GHz; Cu; MIMCAP; MOS varactor; RF applications; RF processing; SOI CMOS technology; battery-operated electronic devices; high-Q passives; inductor; inverter delay; logic-block power switches; low voltage performance; low-k ILD; low-power digital applications; low-power digital processing; low-standby-power SRAM; minimum power dissipation; multilevel Cu interconnects; optimized RF properties; optimized power-saving; partially-depleted SOI CMOS technology; peak NFET performance; peak simulated differential Q; resistors; thick-gate-oxide FETs; thin-gate-oxide FETs; threshold voltage; wireless communication; CMOS technology; Delay; FETs; Inductors; Inverters; Low voltage; Power dissipation; Radio frequency; Random access memory; Varactors;
Conference_Titel :
VLSI Technology, 2001. Digest of Technical Papers. 2001 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
4-89114-012-7
DOI :
10.1109/VLSIT.2001.934959