Title :
Aliasing probability for multiple input signature analyzers with dependent inputs
Author :
Williams, Thomas W. ; Daehn, Wilfried
Author_Institution :
IBM Corp., Boulder, CO, USA
Abstract :
The authors consider the aliasing probability in multiple-input data compressors used in self-testing networks. It is shown that a far more general class of linear machines, linear-feedback shift registers can be used for data-compression purposes. The steady-state value of the aliasing probability is independent of the correlation of the data streams at the inputs of the data compressor. The function of these machines is modeled by a Markov process. The aliasing probability is the same as for the well-understood signature analysis registers with a single input. An easy-to-check criterion is given to decide whether a given linear machine falls into this class of multiple-input data compressors. Two special kinds of circuits are analyzed in more detail with respect to their aliasing properties: linear-feedback shift registers with multiple inputs and linear cellular automata. Simulation results show the effect of the next state function on the steady-state value of the aliasing probability and the effect of correlation on the transient
Keywords :
feedback; finite automata; logic analysers; logic testing; shift registers; Markov process; aliasing probability; data compressors; dependent inputs; linear cellular automata; linear-feedback shift registers; multiple input signature analyzers; self-testing networks; simulation results; Automatic testing; Built-in self-test; Circuit faults; Compressors; Data compression; Fault detection; Feedback circuits; Linear feedback shift registers; Markov processes; Steady-state;
Conference_Titel :
CompEuro '89., 'VLSI and Computer Peripherals. VLSI and Microelectronic Applications in Intelligent Peripherals and their Interconnection Networks', Proceedings.
Conference_Location :
Hamburg
Print_ISBN :
0-8186-1940-6
DOI :
10.1109/CMPEUR.1989.93497
