DocumentCode :
3262709
Title :
An automated, efficient and static bit-width optimization methodology towards maximum bit-width-to-error tradeoff with affine arithmetic model
Author :
Pu, Yu ; Ha, Yajun
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
fYear :
2006
fDate :
24-27 Jan. 2006
Abstract :
Ideally, bit-width analysis methods should be able to find the most appropriate bit-widths to achieve the optimum bit-width-to-error tradeoff for variables and constants in high level DSP algorithms when they are implemented into hardware. The tradeoff enables the fixed-point hardware implementation to be area efficient but still within the allowed error tolerance. Unfortunately, almost all the existing static bit-width analysis methods are Interval Arithmetic (IA) based that may overestimate bit-widths and enable fairly pessimistic bit-width-to-error tradeoff. We have developed an automated and efficient bit-width optimization methodology that is Affine Arithmetic (AA) based. Experiments have proven that, compared to the previous static analysis methods, our methodology not only dramatically reduces the fractional bit-width by more than 35% but also slightly reduces the integer bit-width. In addition, our probabilistic error analysis method further enlarges the bit-width-to-error tradeoff.
Keywords :
error statistics; high level synthesis; program diagnostics; affine arithmetic model; bit-width-to-error tradeoff; probabilistic error analysis; static analysis; static bit-width optimization; Algorithm design and analysis; Computer applications; Computer languages; Digital arithmetic; Digital signal processing; Error analysis; Hardware; Optimization methods; Prototypes; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN :
0-7803-9451-8
Type :
conf
DOI :
10.1109/ASPDAC.2006.1594798
Filename :
1594798
Link To Document :
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