DocumentCode :
326297
Title :
Texture vector analysis using regular synthetic texture patterns
Author :
Berger, Michael
Author_Institution :
Telegrafenberg, Potsdam, Germany
Volume :
2
fYear :
1998
fDate :
6-10 Jul 1998
Firstpage :
1071
Abstract :
Image texture is described by different methods as e.g. variance analysis and 2nd order statistics based on co-occurrence matrices. Statistics based on co-occurrence matrices are considered to provide the most precise descriptors but can be considered operational due to the extreme computing power needed for calculation. Further, statistics calculated from co-occurrence matrices are very sensitive to the size of the moving window describing the center pixel´s texture property. Thus, different texture descriptors can result for one and the same texture pattern by the use of different window sizes. Texture vectors seems to solve these problems. Texture vectors are defined by 5-dimensional vectors as the sum of all frequency dependency vectors in a given window. The first 4 dimensions are defined by normalized frequency of the co-occurrence of grey level combinations. The 5th dimension is given by the distance considered by calculating the co-occurrence. Processing time is decreased by recoding grey values according to their value. Different regular texture patterns were used to analyze the texture vectors in comparison to common used texture descriptors
Keywords :
geophysical signal processing; geophysical techniques; image texture; remote sensing; co-occurrence matrices; co-occurrence matrix; geophysical measurement technique; grey level combinations; grey values; image processing; image texture; land surface; regular synthetic texture patterns; remote sensing; second order statistics; terrain mapping; texture descriptor; texture vector analysis; variance analysis; Data mining; Frequency; Image analysis; Image texture; Image texture analysis; Pattern analysis; Spatial resolution; Statistical analysis; Statistics; TV;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4403-0
Type :
conf
DOI :
10.1109/IGARSS.1998.699676
Filename :
699676
Link To Document :
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