Title :
Neural network information criterion for the optimal number of hidden units
Author_Institution :
Dept. of Inf. Sci., Cental Res. Inst. of Electr. Power Ind., Tokyo, Japan
Abstract :
This paper presents a statistical approach to solve the problem of model selection, or determine the number of hidden units for artificial neural networks. The authors´ approach analyzes the relation between the learning error which is a measure of the convergence and the general generalization error which is a measure of the quality of approximation by a statistical discrepancy and a discrepancy accompanied by the learning algorithm. The author makes clear the relation between the learning error and the generalization error by analyzing the two discrepancies statistically. Moreover, the author derives a new information criterion based on a given learning set by this relation. The author calls this information criterion a “neural network information criterion: NNIC”. The author can construct the optimal architecture of multi-layered neural networks for given learning examples by using this criterion. This paper shows that this criterion is effective by a simple simulation which compares NNIC with NIC. Finally, the author points out that NNIC is the generalized form of some information criteria
Keywords :
convergence; generalisation (artificial intelligence); learning (artificial intelligence); multilayer perceptrons; statistical analysis; artificial neural networks; convergence; generalization error; hidden units; learning error; learning set; model selection; multi-layered neural networks; neural network information criterion; quality of approximation; statistical approach; statistical discrepancy; Algorithm design and analysis; Approximation algorithms; Artificial neural networks; Convergence; Error analysis; Feedforward neural networks; Information science; Multi-layer neural network; Neural networks; Parameter estimation; Parametric statistics; Stochastic processes; Supervised learning;
Conference_Titel :
Neural Networks, 1995. Proceedings., IEEE International Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-2768-3
DOI :
10.1109/ICNN.1995.488108