مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3263583

Title :

Status And Trends In SOI CMOS Technology

Author :

Colinge, Jean-Pierre

fYear :

1997

fDate :

3-5 June 1997

Firstpage :

118

Lastpage :

122

Keywords :

CMOS technology; Coupling circuits; Laboratories; Low voltage; MOSFETs; Microelectronics; Microwave frequencies; Parasitic capacitance; Random access memory; Threshold voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on

Conference_Location :

Taipei, Taiwan

ISSN :

1524-766X

Print_ISBN :

0-7803-4131-7

Type :

conf

DOI :

10.1109/VTSA.1997.614741

Filename :

614741

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3263583