DocumentCode :
3263951
Title :
0.98 μm wavelength InGaAs/GaAs/AlGaAs strained quantum-well laser diodes with high reliability
Author :
Yaegashi, H. ; Nakajima, M. ; Nakamura, K. ; Nonaka, T. ; Horikawa, H.
Author_Institution :
Semicond. Technol. Lab., Oki Electr. Ind. Co. Ltd., Tokyo, Japan
Volume :
2
fYear :
1997
fDate :
10-13 Nov 1997
Firstpage :
70
Abstract :
0.98 μm wavelength laser diodes are regarded as the most suitable pumping sources for erbium-doped fiber amplifiers (EDFA) because of their low noise amplifying characteristic and high pumping efficiency. The chief consideration is to establish long term reliability by overcoming sudden failures caused by catastrophic optical damage (COD). We have been developing InGaAs/GaAs/AlGaAs strained single quantum-well ridge waveguide laser diodes emitting at 0.98 μm wavelength. In this paper, we describe reliability of our laser diodes, as well as their structure and initial characteristics. They have been showing very stable, operation throughout 1×106 device-hours life tests. It should be noted that our laser diodes showed no evidence for decreases in COD levels with aging
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; laser reliability; quantum well lasers; waveguide lasers; 0.98 micron; InGaAs-GaAs-AlGaAs; aging; catastrophic optical damage; erbium-doped fiber amplifier; failure; life testing; low noise amplification; pumping source; reliability; strained single quantum-well ridge waveguide laser diode; Diode lasers; Erbium-doped fiber amplifier; Gallium arsenide; Indium gallium arsenide; Laser excitation; Optical noise; Optical waveguides; Quantum well lasers; Quantum wells; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-3895-2
Type :
conf
DOI :
10.1109/LEOS.1997.645250
Filename :
645250
Link To Document :
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